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言語種別	英語
発行・発表の年月	2009/12
形態種別	国際会議論文
査読	査読あり
標題	A Multi-Line De-Embedding Technique for mm-Wave CMOS Circuits
執筆形態	共著
掲載誌名	IEEE Asia Pacific Microwave Conference
掲載区分	国外
出版社・発行元	IEEE
巻・号・頁	pp.143-146
著者・共著者	Naoki Takayama, Kouta Matsushita, Shogo Ito, Ning Li, Keigo Bunsen, Kenichi Okada, and Akira Matsuzawa
概要	This paper proposes a de-embedding method for on-chip S-parameter measurements at mm-wave frequency. The proposed method uses only two transmission lines with different length. In the proposed method, a parasitic-component model extracted from two transmission lines can be used for de-embedding for other-type DUTs like transistor, apacitor, inductor, etc. The experimental results show that the error in characteristic impedance between the different-length transmission lines is less than 1Ω. 副筆