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言語種別	英語
発行・発表の年月	2010/06
形態種別	学術論文
査読	査読あり
標題	A De-Embedding Method Using Different-Length Transmission Lines for mm-Wave CMOS Device Modeling
執筆形態	共著
掲載誌名	IEICE Transactions on Electronics
掲載区分	国内
概要	This paper proposes a de-embedding method for on-chip S-parameter measurements at mm-wave frequency. The proposed method uses only two transmission lines with different length. In the proposed method, a parasitic-component model extracted from two ransmission lines can be used for de-embedding for other-type DUTs like transistor, capacitor, inductor, etc. The experimental results show that the error in characteristic impedance between the different-length transmission lines is less than 0.7% above 40GHz. The extracted pad model is also shown. 副筆